Preview

The Fundamentals of Mixed Signal Testing

Good Essays
Open Document
Open Document
2650 Words
Grammar
Grammar
Plagiarism
Plagiarism
Writing
Writing
Score
Score
The Fundamentals of Mixed Signal Testing
The Fundamentals of Mixed Signal Testing
Course Information
The Fundamentals of Mixed Signal Testing course is designed to provide the foundation of knowledge that is required for testing modern mixed signal devices using ATE equipment.
Many engineers are intimidated when confronting mixed signal test for the first time. However, the percentage of VLSI and SOC devices containing analog functions, data converters, DSPs, and similar circuits continues to grow. No longer a specialty or niche, mixed signal technology has entered the mainstream.

The Course
The course first introduces the instrumentation of a Mixed Signal Test System, with emphasis on the DSP
(digital signal processing) capabilities. Ample time is spent explaining the mathematics necessary to fully understand signal sampling and waveform synthesis. Specifications for mixed signal devices are discussed and the method of verifying each individual parameter is explained in detail.
The testing of Digital to Analog and Analog to Digital converters is covered step by step including device conditioning, analog filtering, grounding issues and noise effects. These details are fundamental to most all types of mixed signal circuits. Practical aspects of test development and debug are also discussed.
To insure that each student gains a complete understanding of the concepts presented, virtual test instrumentation is used. Laptop computers play an essential role during the class to provide actual "hands on" lab experience. The labs demonstrate the principles of sampling, Fourier series, sinusoidal waveforms,
FFT/DFT/Inverse Fourier transforms, signal generation and other mixed signal testing concepts. Each student receives a personal copy of the DSP Lab software, which can be kept for later use and a 300+ page reference manual titled "Fundamentals of Mixed Signal Testing".

Who Should Attend
Test and Product Engineers, Engineering Managers and Sales Engineers have all benefited from this course
– it is the logical

You May Also Find These Documents Helpful

  • Satisfactory Essays

    Nt1310 Unit 1 Lab Report

    • 344 Words
    • 2 Pages

    In experiment 2 our main objective was to understand the analysis of resistors, inductors and capacitors in a sine wave circuit. we measured the impedance of the inductor and capacitor using a current sensing resistor. Inductive reactance is the opposition to the flow of current, and capacitive reactance is the opposition to the flow of charge. The tools we used for this experiment a pair of resistors, an inductor, a capacitor, dual channel oscilloscope, audio oscillator, and a digital multimeter. Using the oscilloscope we where able to measure the devises easily. Using the audio oscillator too change our setting to the wright context we measured the Vrms of our circuits. Using the Vrms we were able to find all of our unknowns using equations and our knowledge of circuit analysis.…

    • 344 Words
    • 2 Pages
    Satisfactory Essays
  • Satisfactory Essays

    Nt1310 Unit 4 Test Paper

    • 371 Words
    • 2 Pages

    • Certification Testers – Test the cabling to guarantee that it meets particular cabling performance measures. A decent certification accurate analyzer is anything but difficult to utilize, yet can rapidly do unpredictable and accurate estimations.…

    • 371 Words
    • 2 Pages
    Satisfactory Essays
  • Good Essays

    1310 unit 4

    • 440 Words
    • 2 Pages

    Continuity tester: A toll used to determine whether an electrical circuit can be made between to points.…

    • 440 Words
    • 2 Pages
    Good Essays
  • Satisfactory Essays

    In this lab, I read graphs and the spectrum analyzer to answer all different questions about them. I was able to identify interference and overlapping of signals, to identify the strength of signals, and to identify they type of signal being put out.…

    • 524 Words
    • 3 Pages
    Satisfactory Essays
  • Powerful Essays

    Abstract
.................................................................................................................................
1
 Introduction
........................................................................................................................
3
 Test
Method
.........................................................................................................................
3
 Diagram
of
the
test
setup
........................................................................................................
3
 . Figure
1.
..................................................................................................................................................................
3
 Diagram
of
dial
gauge
setup
...................................................................................................
4
 Figure
2.
..................................................................................................................................................................
4
 Method
used…

    • 2020 Words
    • 9 Pages
    Powerful Essays
  • Satisfactory Essays

    Learning and Work Place

    • 576 Words
    • 3 Pages

    To improve my knowledge and skills I am taking these courses at my work place.…

    • 576 Words
    • 3 Pages
    Satisfactory Essays
  • Powerful Essays

    Teradyne Jaguar Project

    • 2237 Words
    • 7 Pages

    Semiconductors cover a very broad range of devices which can be classified by 2 main categories: memory, and system on chip. Each type of device performs a different task in an electronic system, with its own set of complex manipulations that it performs on the electrical signals that come as inputs. As semiconductors grew over the years to become smaller and more powerful, minor flaws in the production process could prevent an entire device from functioning correctly. This resulted in a high demand for testing equipment that could determine if a component was functional or not. This simple idea is quite a…

    • 2237 Words
    • 7 Pages
    Powerful Essays
  • Good Essays

    Placent Testing

    • 1663 Words
    • 7 Pages

    Enclosed are important instructions about accessing the online tests, system/hardware requirements, preparing for the tests, and accessing technical as well as test-related support, should you need it. I strongly encourage you to read this information completely and thoroughly before starting your tests. These instructions will assist you in minimizing technical challenges and/or user error that may result in lost testing time or invalid test results.…

    • 1663 Words
    • 7 Pages
    Good Essays
  • Powerful Essays

    One of the challenges in testing SOC is dealing with the large size of test data that must be stored in the tester and transferred between the tester and the chip. The cost of automatic test equipment (ATE) increases significantly with the increase in their speed, channel capacity and memory. As testers have limited speed, channel bandwidth and memory, the need for test data reduction becomes imperative.…

    • 13186 Words
    • 53 Pages
    Powerful Essays
  • Powerful Essays

    proportional to the input voltage 's rate of change. The objective of this experiment is to get…

    • 1164 Words
    • 6 Pages
    Powerful Essays
  • Powerful Essays

    System Test Plan !!!! DRAFT DRAFT !!!! April 26, 1999 Accepted by: Name Date Department Name Department Date Name Department Date Name Department Date |1.…

    • 1618 Words
    • 7 Pages
    Powerful Essays
  • Good Essays

    Each student uses a standardized, robust notebook/tablet researched and chosen by the School. Secondary devices are welcome outside of the classroom.…

    • 1284 Words
    • 7 Pages
    Good Essays
  • Powerful Essays

    Wind

    • 2617 Words
    • 11 Pages

    For indication, the tester (see Fig.1) uses a number of LEDs driven by ubiquitous display driver IC LM3915 (IC1). The display panel shows the relative magnitude of conductance (reciprocal of resistance) between the two test probes when these are inserted in the soil.…

    • 2617 Words
    • 11 Pages
    Powerful Essays
  • Good Essays

    Also, the interaction between package and hardware is tested in integration testing if package and hardware elements have any relation. it should represent each white box testing and recorder testing.…

    • 951 Words
    • 4 Pages
    Good Essays
  • Good Essays

    AE Testing Lab Report

    • 1308 Words
    • 6 Pages

    Various researchers had worked in the field of AE testing. A brief review of the work carried out in this area is explained in this section.…

    • 1308 Words
    • 6 Pages
    Good Essays